Contactless defects detection using modulated photoluminescence technique: model for a single shockley-read-hall trap in a semiconductor thin layer
HIGHLIGHTS What: The authors focus on the use of a contactless frequency domain technique: modulated photoluminescence (MPL), and show its potential to detect defects. In line with this preceding work, the goals of this article are (i) to verify the analytical calculation by parametric numerical studies, (ii) to take into account the effect of the defect density on the V-Shape appearance, (iii) to extend the study to undoped materials. It is then possible to choose three of them, and the resolution the authors develop further will use equations and_( 3 ) and_( 4 ). At this point of this article, the authors aim to further investigate the appearance of V-Shapes and Monotonic-Shapes in a given material. Who: Baptiste Bérenguier and colleagues from the Institut Photovoltaïque d’Ile de France (ITE) , Boulevard Thomas Gobert , Palaiseau , France have published the research work: Contactless defects detection using modulated photoluminescence technique: model for a single Shockley...